[Federal Register Volume 74, Number 166 (Friday, August 28, 2009)]
[Notices]
[Page 44350]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: E9-20824]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

Pursuant to Section 6(c) of the Educational, Scientific and Cultural 
Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. 
L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments on the 
question of whether instruments of equivalent scientific value, for the 
purposes for which the instruments shown below are intended to be used, 
are being manufactured in the United States.
Comments must comply with 15 CFR 301.5(a)(3) and (4) of the regulations 
and be postmarked on or before September 17, 2009. Address written 
comments to Statutory Import Programs Staff, Room 3720, U.S. Department 
of Commerce, Washington, D.C. 20230. Applications may be examined 
between 8:30 a.m. and 5 p.m. at the U.S. Department of Commerce in Room 
3720.
Docket Number: 09-047. Applicant: Washington State University, P.O. Box 
641020, Pullman, WA 99164. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument 
will be used to study bulk amorphous metal alloys, nano-particle 
ceramics, nano-particle metals, polymer matrices and ceramic matrices. 
The instrument will be used to measure the thickness of deposited 
coatings at 1.0 nm resolution. Justification for Duty-Free Entry: No 
instruments of same general category are manufactured in the United 
States. Application accepted by Commissioner of Customs: July 31, 2009.

    Dated: August 24, 2009.
Christopher Cassel,
Acting Director, IA Subsidies Enforcement Office.
[FR Doc. E9-20824 Filed 8-27-09; 8:45 am]
BILLING CODE 3510-DS-S