[Federal Register Volume 75, Number 160 (Thursday, August 19, 2010)]
[Notices]
[Page 51239]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-20613]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before September 8, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 10-052. Applicant: Argonne National Laboratory, 
UChicago Argonne, LLC, 9700 South Cass Avenue, Lemont, IL 60439. 
Instrument: Pilatus 2M Pixel Detector System. Manufacturer: Dectris 
Ltd., Switzerland. Intended Use: The instrument will be used to obtain 
fine structural information for materials during chemical reactions, 
such as catalysis. The instrument has gatable data processing as well 
as high time resolution and high spatial resolution, which makes the 
instrument unique. Other unique features include direct detection of x-
rays in single-photon-counting mode, a radiation-tolerant design, a 
high dynamic range, a short readout time, high frame rates, high 
counting rates, and shutterless operation. Justification for Duty-Free 
Entry: There are no instruments of the same general category being 
manufactured in the United States. Application accepted by Commissioner 
of Customs: July 23, 2010.
    Docket Number: 10-053. Applicant: Argonne National Laboratory, 
UChicago Argonne, LLC, 9700 South Cass Avenue, Lemont, IL 60439. 
Instrument: UHV low-Temperature Atomic Force Microscope System for 
Application in High Magnetic Fields. Manufacturer: Omicron 
Nanotechnology, Germany. Intended Use: The instrument will be used to 
study atomic scale electrical and magnetic properties of electrically 
conduction as well as insulation nanostructures prepared by in situ 
deposition onto clean surfaces. In-situ capacities allow the 
preparation of clean and well-defined nanostructures on pristine 
surfaces which would contaminate otherwise. Unique features of this 
instrument include the capability of applying large magnetic fields (>3 
Tesla), which is necessary to allow the clear separation of structural, 
electronic, and magnetic signals of nanostructures and the evaluation 
of the properties to be studied in these experiments. The instrument 
also has in-situ preparation capability and the ability to operate in 
low temperatures. Further, the instrument is capable of performing 
imaging in two main modes of operation, i.e., scanning tunneling 
microscopy and atomic force microscopy. Justification for Duty-Free 
Entry: There are no instruments of the same general category being 
manufactured in the United States. Application accepted by Commissioner 
of Customs: July 21, 2010.

    Dated: August 11, 2010.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2010-20613 Filed 8-18-10; 8:45 am]
BILLING CODE 3510-DS-P