[Federal Register Volume 75, Number 160 (Thursday, August 19, 2010)]
[Notices]
[Page 51239]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-20616]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Massachusetts Amherst, et al.; Notice of 
Consolidated Decision on Applications for Duty-Free Entry of Electron 
Microscopes

    This is a decision consolidated pursuant to Section 6(c) of the 
Educational, Scientific, and Cultural Materials Importation Act of 1966 
(Pub. L. 89-651, as amended by Public Law 106-36; 80 Stat. 897; 15 CFR 
part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. 
in Room 3720, U.S. Department of Commerce, 14th and Constitution 
Avenue., NW., Washington, DC.

    Docket Number: 10-044. Applicant: University of Massachusetts 
Amherst, Amherst, MA 01003. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: See notice at 
75 FR 42377, July 21, 2010.

    Docket Number: 10-047. Applicant: Appalachian State University, 
Boone, NC 28608. Instrument: Electron Microscope.
    Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 
42377, July 21, 2010.

    Docket Number: 10-048. Applicant: The University of Texas at El 
Paso, El Paso, TX 79968. Instrument: Electron Microscope. Manufacturer: 
JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 42377, July 21, 
2010.

    Docket Number: 10-050. Applicant: Stanford University School of 
Medicine, Stanford, CA 94305-5301. Instrument: Electron Microscope. 
Manufacturer: JEOL, Ltd., Japan. Intended Use: See notice at 75 FR 
42377, July 21, 2010.

    Comments: None received. Decision: Approved. No instrument of 
equivalent scientific value to the foreign instrument, for such 
purposes as these instruments are intended to be used, was being 
manufactured in the United States at the time the instruments were 
ordered. Reasons: Each foreign instrument is an electron microscope and 
is intended for research or scientific educational uses requiring an 
electron microscope. We know of no electron microscope, or any other 
instrument suited to these purposes, which was being manufactured in 
the United States at the time of order of each instrument.

    Dated: August 12, 2010.
Christopher Cassel,
Director, Subsidies Enforcement Office, Import Administration.
[FR Doc. 2010-20616 Filed 8-18-10; 8:45 am]
BILLING CODE 3510-DS-P