[Federal Register Volume 75, Number 183 (Wednesday, September 22, 2010)]
[Notices]
[Pages 57738-57739]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-23716]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before October 12, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce,

[[Page 57739]]

Washington, DC 20230. Applications may be examined between 8:30 a.m. 
and 5 p.m. at the U.S. Department of Commerce in Room 3720.
    Docket Number: 10-055. Applicant: National Institutes of Health, 49 
Convent Drive MSC 4480, Bldg. 49, Rm 5W14, Bethesda, MD 20892. 
Instrument: Electron Microscope. Manufacturer: JEOL Limited, Japan. 
Intended Use: The instrument will be used to study primarily 
neurological tissue and cells from mice, zebrafish, and fruit flies. 
The properties of the materials being investigated are those of a 
biological nature, which require a very high resolution. Justification 
for Duty-Free Entry: There are no instruments of the same general 
category manufactured in the United States. Application accepted by 
Commissioner of Customs: August 20, 2010.

    Docket Number: 10-056. Applicant: University of Notre Dame, 
Procurement Services 709 Grace Hall Notre Dame, Indiana 46556. 
Instrument: Electron Microscope. Manufacturer: FEI Company, the 
Netherlands. Intended Use: The instrument will be used in bio-
geochemical and bio-engineering research. Many of the processes of 
interest are at or near the nano-scale so the instrument is important 
for the analysis of structures and compositions. Some projects can only 
be accomplished with the improved resolution and analytical 
capabilities of the instrument. Justification for Duty-Free Entry: 
There are no instruments of the same general category manufactured in 
the United States. Application accepted by Commissioner of Customs: 
September 1, 2010.

    Docket Number: 10-057. Applicant: Curators of the University of 
Missouri, 1201 N. State St. G5C Campus Support Facility Rolla, MO 
56049. Instrument: Electron Microscope. Manufacturer: FEI Company, the 
Netherlands. Intended Use: The instrument will be used to investigate 
carbon/nitrogen effects on steel lattice parameters, atomic abruptness 
of electrochemically produced metal/metal oxide layers, orientation 
relationships and defects in friction stir processed metal alloys, and 
nanoparticle size, shape and chemistry on PEM fuel cell porous 
membranes. Justification for Duty-Free Entry: There are no instruments 
of the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: August 20, 2010.

    Docket Number: 10-058. Applicant: SUNY Upstate Medical University. 
Instrument: Electron Microscope. Manufacturer: JEOL, Ltd., Japan. 
Intended Use: The instrument will be used to observe changes in 
ultrastructure of cytoskeletal and membrane elements of cells as a 
result of specific mutations or diseases states. Justification for 
Duty-Free Entry: There are no instruments of the same general category 
manufactured in the United States. Application accepted by Commissioner 
of Customs: August 23, 2010.

    Dated: September 15, 2010.
Gregory W. Campbell,
Acting Director, IA Subsidies Enforcement Office.
[FR Doc. 2010-23716 Filed 9-21-10; 8:45 am]
BILLING CODE 3510-DS-P