[Federal Register Volume 75, Number 213 (Thursday, November 4, 2010)]
[Notices]
[Page 67949]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-27885]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before November 24, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 10-046. Applicant: University of Connecticut, 
Purchasing Department, 3 North Hillside Road, Unit 6076, Storrs, CT 
06269-6076. Instrument: Electron Microscope. Manufacturer: FEI Company, 
Czech Republic. Intended Use: The instrument will be used for many 
experiments, such as studying the mechanism of the growth of nano 
particles of TiO2 from solution for dye-sensitized solar cell. The 
instrument has unique features that allow operation in ESEM and in-situ 
modes. Justification for Duty-Free Entry: There are no instruments of 
the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: September 22, 2010.
    Docket Number: 10-060. Applicant: The University of Texas at 
Arlington, 7300 Jack Newell Blvd. S., Fort Worth, TX 76118. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used for automated manipulation of 
nanoscale components and their assembly/integration into a micro/meso 
scale device. The instrument is the only instrument that can provide 
ultra-high resolution images in both high and low vacuum pressure 
ranges. Justification for Duty-Free Entry: There are no instruments of 
the same general category manufactured in the United States. 
Application accepted by Commissioner of Customs: October 5, 2010.

    Dated: October 29, 2010.
Gregory Campbell,
Acting Director, IA Subsidies Enforcement Office.
[FR Doc. 2010-27885 Filed 11-3-10; 8:45 am]
BILLING CODE 3510-DS-P