[Federal Register Volume 75, Number 228 (Monday, November 29, 2010)]
[Notices]
[Pages 73034-73035]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-29967]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before December 20, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 10-065. Applicant: Vanderbilt University, 2201 West 
End Avenue, Nashville, TN 37235. Instrument: Electron Microscope. 
Manufacturer: FEI Company, Czech Republic. Intended Use: The instrument 
will be used to support general biological investigations into 
structure function relationships. Key capabilities of the instrument 
include extended

[[Page 73035]]

variable pressure capability, low kV and Schottky field emission 
source, secondary and backscatter detection, and a temperature control 
Peltier stage. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: October 27, 
2010.
    Docket Number: 10-066. Applicant: Vanderbilt University, 2201 West 
End Avenue, Nashville, TN 37235. Instrument: Electron Microscope. 
Manufacturer: JEOL Limited, Japan. Intended Use: The instrument will be 
used to study cement-based composites, environmental materials, and 
geological samples for their microstructure, phase characteristics, and 
interfacial processes. This instrument can image and analyze samples 
that are completely wet while carrying the humidity and pressure in the 
specimen chamber. This instrument also offers a WetSTEM detector for 
imaging completely wet samples in both bright field (BF) and dark field 
(DF) modes without special sample handling/encapsulation. Justification 
for Duty-Free Entry: There are no instruments of the same general 
category manufactured in the United States. Application accepted by 
Commissioner of Customs: October 27, 2010.

     Dated: November 22, 2010.
Gregory Campbell,
Acting Director, IA Subsidies Enforcement Office.
[FR Doc. 2010-29967 Filed 11-26-10; 8:45 am]
BILLING CODE 3510-DS-P