[Federal Register Volume 75, Number 54 (Monday, March 22, 2010)]
[Notices]
[Page 13486]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-6259]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before April 12, 2010. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, D.C. 20230. Applications may be 
examined between 8:30 A.M. and 5:00 P.M. at the U.S. Department of 
Commerce in Room 3720.
    Docket Number: 09-067. Applicant: West Virginia University, One 
Waterfront Place, PO Box 6024, Morgantown, WV 26506. Instrument: 
Electron Microscope. Manufacturer: JEOL, Japan. Intended Use: The 
instrument will be used to study the microstructure and chemistry of a 
variety of metallic, ceramic and semiconductor materials. This 
instrument is capable of imaging crystal structure and defects from the 
micron to atomic scale using TEM and HREM. A unique feature of this 
instrument is an analytical pole piece for high resolution work while 
maintaining high tilting capability. Justification for Duty-Free Entry: 
There are no domestic manufacturers of this type of electron 
microscope. Application accepted by Commissioner of Customs: December 
17, 2009.
    Docket Number: 10-003. Applicant: St. Lawrence University, 23 
Romoda Drive, Canton, NY 13617. Instrument: Electron Microscope. 
Manufacturer: FEI, Czech Republic. Intended Use: This instrument will 
be used in the advanced study of diverse fields such as geochemistry, 
sedimentology and neurophysiology. This instrument has several SE 
detectors that are optimized for use in high-vacuum, low-vacuum and 
ultra-low vacuum environments and can be freely switched between these 
three modes. This allows for the investigation of conductive, non-
conductive and high vacuum incompatible specimens. Justification for 
Duty-Free Entry: No instruments of same general category are 
manufactured in the United States. Application accepted by Commissioner 
of Customs: March 3, 2010.

    Dated: March 16, 2010.
Christopher Cassel,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2010-6259 Filed 3-19-10; 8:45 am]
BILLING CODE 3510-DS-S