[Federal Register Volume 75, Number 77 (Thursday, April 22, 2010)]
[Notices]
[Pages 20982-20983]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2010-9354]


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DEPARTMENT OF COMMERCE

International Trade Administration


University of Michigan, et al., Notice of Consolidated Decision 
on Applications for Duty-Free Entry of Scientific Instruments

This is a decision pursuant to Section 6(c) of the Educational, 
Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-
651, as amended by Pub. L.106-36; 80 Stat. 897; 15 CFR part 301). 
Related records can be viewed between 8:30 A.M. and 5:00 P.M. in Room 
3705, U.S. Department of Commerce, 14th and Constitution Ave, NW, 
Washington, D.C.
Comments: None received. Decision: Approved. We know of no instruments 
of equivalent scientific value to the foreign instruments described 
below, for such purposes as this is intended to be used, that was being 
manufactured in the United States at the time of its order.
Docket Number: 10-002. Applicant: University of Michigan, Ann Arbor, MI 
49109-2122. Instrument: Tester for TFT Imager. Manufacturer: Siemens 
AG, Corporate Technology, Germany. Intended Use: See notice at 75 FR 
12175, March 15, 2010. Reasons: This instrument must be capable of 
measuring dynamic rate, linearity and noise. It must also support 
voltages in the rate of -10 V to 20 V and support maximum 60 Hz 
scanning speed. Another pertinent specification for this instrument is 
that it must be capable of working with an imager, having 128 rows and 
128 columns. We know of no instrument suited to these purposes, which 
was being manufactured in the United States at the time of order of 
this instrument.
Docket Number: 10-004. Applicant: State University of New York College 
at Geneseo, Geneseo, NY 14454. Instrument: MultiView 2000TS Microscope 
System. Manufacturer: Nanonics Imaging Ltd., Israel. Intended Use: See 
notice at 75 FR 13486, March 22, 2010. Reasons: A pertinent feature of 
this instrument is the ability to switch between scanning the tip and 
the sample stage. Other unique features include the ability to use 
conventional AFM type silicon cantilevers as well as cantilevered 
optical fiber probes with exposed probed geometry, providing normal 
force sensing; the capability to image side walls with an exposed tip 
glass AFM probe and the ability to image in both NSOM and AFM with AC 
operating modes. We know of no instrument suited to these purposes, 
which was being manufactured in the

[[Page 20983]]

United States at the time of order of this instrument.April 16, 2010

Christopher Cassel,
Director, Subsidies Enforcement Office, Import Administration
[FR Doc. 2010-9354 Filed 4-21-10; 8:45 am]
BILLING CODE 3510-DS-S