[Federal Register Volume 76, Number 10 (Friday, January 14, 2011)]
[Notices]
[Page 2647]
From the Federal Register Online via the Government Publishing Office [www.gpo.gov]
[FR Doc No: 2011-776]


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DEPARTMENT OF COMMERCE

International Trade Administration


Application(s) for Duty-Free Entry of Scientific Instruments

    Pursuant to Section 6(c) of the Educational, Scientific and 
Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended 
by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301), we invite comments 
on the question of whether instruments of equivalent scientific value, 
for the purposes for which the instruments shown below are intended to 
be used, are being manufactured in the United States.
    Comments must comply with 15 CFR 301.5(a)(3) and (4) of the 
regulations and be postmarked on or before February 3, 2011. Address 
written comments to Statutory Import Programs Staff, Room 3720, U.S. 
Department of Commerce, Washington, DC 20230. Applications may be 
examined between 8:30 a.m. and 5 p.m. at the U.S. Department of 
Commerce in Room 3720.

    Docket Number: 10-070. Applicant: Stanford University, 450 Serra 
Mall, Stanford, CA 94305. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will be used for a wide variety of research projects, 
including the study of graphene nanoribbons, carbon nanotube networks 
as transparent electrodes, and functionalized nanoparticles and 
nanotubes for medical applications. The instrument will offer much 
improved resolution, as well as enhanced capabilities in characterizing 
insulating materials. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: December 22, 
2010.
    Docket Number: 10-071. Applicant: Stanford University, 450 Serra 
Mall, Stanford, CA 94305. Instrument: Electron Microscope. 
Manufacturer: FEI Company, the Netherlands. Intended Use: The 
instrument will be used for a wide variety of research projects 
including the study of artificial atoms, nanomagnetic research, and 
advanced semiconductor devices. The device will be used to complement a 
high-resolution electron beam lithography system. Electron beam 
lithography is required for the creation of the fine electrode or etch 
patterns to define an artificial atom, for quantitative detection of 
local magnetic fields, and to fabricate semiconductor devices with 
extreme short channels. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: December 22, 
2010.
    Docket Number: 10-074. Applicant: Wake Forest University Health 
Sciences, Medical Center Blvd., Winston-Salem, NC 27157. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used for the examination of the 
fine structural details of diseased tissues, such as cancer, the 
structure of biological molecules, such as DNA and proteins, and the 
location of specifically labeled molecules inside these structures. The 
instrument is necessary to achieve sufficient resolution and detail for 
the research. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: December 23, 
2010.
    Docket Number: 10-075. Applicant: The Virginia Tech Carilion 
Research Institute, 2 Riverside Circle, Roanoke, VA 24016. Instrument: 
Electron Microscope. Manufacturer: FEI Company, Czech Republic. 
Intended Use: The instrument will be used for the examination of 
biological specimens including proteins, protein complexes and other 
cellular constituents. Justification for Duty-Free Entry: There are no 
instruments of the same general category manufactured in the United 
States. Application accepted by Commissioner of Customs: December 23, 
2010.

    Dated: January 7, 2011.
Gregory Campbell,
Director, IA Subsidies Enforcement Office.
[FR Doc. 2011-776 Filed 1-13-11; 8:45 am]
BILLING CODE 3510-DS-P