[Code of Federal Regulations]

[Title 40, Volume 29]

[Revised as of July 1, 2005]

From the U.S. Government Printing Office via GPO Access

[CITE: 40CFR469.10]



[Page 675]

 

                   TITLE 40--PROTECTION OF ENVIRONMENT

 

         CHAPTER I--ENVIRONMENTAL PROTECTION AGENCY (CONTINUED)

 

PART 469_ELECTRICAL AND ELECTRONIC COMPONENTS POINT SOURCE CATEGORY

--Table of Contents

 

                   Subpart A_Semiconductor Subcategory

 

Sec. 469.10  Applicability.









                   Subpart A_Semiconductor Subcategory



Sec.

469.10 Applicability.

469.11 Compliance dates.

469.12 Specialized definitions.

469.13 Monitoring.

469.14 Effluent limitations representing the degree of effluent 

          reduction attainable by the application of the best 

          practicable control technology currently available (BPT).

469.15 Effluent limitations representing the degree of effluent 

          reduction attainable by the application of the best available 

          technology economically achievable (BAT).

469.16 Pretreatment standards for existing sources (PSES).

469.17 New source performance standards (NSPS).

469.18 Pretreatment standards for new sources (PSNS).

469.19 Effluent limitations representing the degree of effluent 

          reduction attainable by the application of the best 

          conventional pollution control technology (BCT).



                Subpart B_Electronic Crystals Subcategory



469.20 Applicability.

469.21 Compliance dates.

469.22 Specialized definitions.

469.23 Monitoring.

469.24 Effluent limitations representing the degree of effluent 

          reduction attainable by the application of the best 

          practicable control technology currently available (BPT).

469.25 Effluent limitations representing the degree of effluent 

          reduction attainable by the application of the best available 

          technology economically achievable (BAT).

469.26 Pretreatment standards for existing sources (PSES).

469.27 New source performance standards (NSPS).

469.28 Pretreatment standards for new sources (PSNS).

469.29 Effluent limitations representing the degree of effluent 

          reduction attainable by the application of the best 

          conventional pollution control technology (BCT).



                 Subpart C_Cathode Ray Tube Subcategory



469.30 Applicability.

469.31 Specialized definitions.

469.32 Monitoring requirements.

469.34 Pretreatment standards for existing sources (PSES).

469.35 New source performance standards (NSPS).

469.36 Pretreatment standards for new sources (PSNS).



               Subpart D_Luminescent Materials Subcategory



469.40 Applicability.

469.41 Specialized definitions.

469.42 New source performance standards (NSPS).

469.43 Pretreatment standards for new sources (PSNS).



    Authority: Secs. 301, 304, 306, 307, 308, and 501 of the Clean Water 

Act (the Federal Water Pollution Control Act Amendments of 1972, as 

amended by the Clean Water Act of 1977, 33 U.S.C. 1311, 1314, 1316, 

1317, 1318, and 1361; 86 Stat. 816, Pub. L. 92-500; 91 Stat. 1567, Pub. 

L. 95-217, unless otherwise noted.



    Source: 48 FR 15394, Apr. 8, 1983, unless otherwise noted.







    The provisions of this subpart are applicable to discharges 

resulting from all process operations associated with the manufacture of 

semiconductors, except sputtering, vapor deposition, and electroplating.